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selftests/bpf: Remove flaky test_btf_id test
With previous patch, one of subtests in test_btf_id becomes flaky and may fail. The following is a failing example: Error: #26 btf Error: #26/174 btf/BTF ID Error: #26/174 btf/BTF ID btf_raw_create:PASS:check 0 nsec btf_raw_create:PASS:check 0 nsec test_btf_id:PASS:check 0 nsec ... test_btf_id:PASS:check 0 nsec test_btf_id:FAIL:check BTF lingersdo_test_get_info:FAIL:check failed: -1 The test tries to prove a btf_id not available after the map is closed. But btf_id is freed only after workqueue and a rcu grace period, compared to previous case just after a rcu grade period. Depending on system workload, workqueue could take quite some time to execute function bpf_map_free_deferred() which may cause the test failure. Instead of adding arbitrary delays, let us remove the logic to check btf_id availability after map is closed. Signed-off-by: Yonghong Song <yonghong.song@linux.dev> Link: https://lore.kernel.org/r/20231214203820.1469402-1-yonghong.song@linux.dev Signed-off-by: Alexei Starovoitov <ast@kernel.org>
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@ -4630,11 +4630,6 @@ static int test_btf_id(unsigned int test_num)
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/* The map holds the last ref to BTF and its btf_id */
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/* The map holds the last ref to BTF and its btf_id */
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close(map_fd);
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close(map_fd);
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map_fd = -1;
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map_fd = -1;
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btf_fd[0] = bpf_btf_get_fd_by_id(map_info.btf_id);
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if (CHECK(btf_fd[0] >= 0, "BTF lingers")) {
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err = -1;
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goto done;
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}
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fprintf(stderr, "OK");
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fprintf(stderr, "OK");
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