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rtc: ds1307: use rtc_add_group

Browse source 
Register frequency test using rtc_add_group to avoid a possible race
condition and simplify the code.

This also moves the attribute to its proper location under the rtc device
instead of the i2c parent device.

Signed-off-by: Alexandre Belloni <alexandre.belloni@bootlin.com>
This commit is contained in:
Alexandre Belloni 2018-09-20 16:35:26 +02:00
parent cfb74916e2
commit 6a5f2a1f4d
1 changed files with 14 additions and 39 deletions
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53
drivers/rtc/rtc-ds1307.c
View file

@ -1050,11 +1050,11 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset)
ctrl_reg); ctrl_reg);
} }
static ssize_t frequency_test_enable_store(struct device *dev, static ssize_t frequency_test_store(struct device *dev,
struct device_attribute *attr, struct device_attribute *attr,
const char *buf, size_t count) const char *buf, size_t count)
{ {
struct ds1307 *ds1307 = dev_get_drvdata(dev); struct ds1307 *ds1307 = dev_get_drvdata(dev->parent);
bool freq_test_en; bool freq_test_en;
int ret; int ret;
@ -1070,11 +1070,11 @@ static ssize_t frequency_test_enable_store(struct device *dev,
return count; return count;
} }
static ssize_t frequency_test_enable_show(struct device *dev, static ssize_t frequency_test_show(struct device *dev,
struct device_attribute *attr, struct device_attribute *attr,
char *buf) char *buf)
{ {
struct ds1307 *ds1307 = dev_get_drvdata(dev); struct ds1307 *ds1307 = dev_get_drvdata(dev->parent);
unsigned int ctrl_reg; unsigned int ctrl_reg;
regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg); regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
@ -1083,10 +1083,10 @@ static ssize_t frequency_test_enable_show(struct device *dev,
"off\n"); "off\n");
} }
static DEVICE_ATTR_RW(frequency_test_enable); static DEVICE_ATTR_RW(frequency_test);
static struct attribute *rtc_freq_test_attrs[] = { static struct attribute *rtc_freq_test_attrs[] = {
&dev_attr_frequency_test_enable.attr, &dev_attr_frequency_test.attr,
NULL, NULL,
}; };
@ -1094,13 +1094,6 @@ static const struct attribute_group rtc_freq_test_attr_group = {
.attrs = rtc_freq_test_attrs, .attrs = rtc_freq_test_attrs,
}; };
static void rtc_calib_remove_sysfs_group(void *_dev)
{
struct device *dev = _dev;
sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);
}
static int ds1307_add_frequency_test(struct ds1307 *ds1307) static int ds1307_add_frequency_test(struct ds1307 *ds1307)
{ {
int err; int err;
@ -1109,27 +1102,9 @@ static int ds1307_add_frequency_test(struct ds1307 *ds1307)
case m41t0: case m41t0:
case m41t00: case m41t00:
case m41t11: case m41t11:
/* Export sysfs entries */ err = rtc_add_group(ds1307->rtc, &rtc_freq_test_attr_group);
err = sysfs_create_group(&(ds1307->dev)->kobj, if (err)
&rtc_freq_test_attr_group);
if (err) {
dev_err(ds1307->dev,
"Failed to create sysfs group: %d\n",
err);
return err; return err;
}
err = devm_add_action_or_reset(ds1307->dev,
rtc_calib_remove_sysfs_group,
ds1307->dev);
if (err) {
dev_err(ds1307->dev,
"Failed to add sysfs cleanup action: %d\n",
err);
sysfs_remove_group(&(ds1307->dev)->kobj,
&rtc_freq_test_attr_group);
return err;
}
break; break;
default: default:
break; break;
@ -1876,11 +1851,11 @@ static int ds1307_probe(struct i2c_client *client,
} }
ds1307->rtc->ops = chip->rtc_ops ?: &ds13xx_rtc_ops; ds1307->rtc->ops = chip->rtc_ops ?: &ds13xx_rtc_ops;
err = rtc_register_device(ds1307->rtc); err = ds1307_add_frequency_test(ds1307);
if (err) if (err)
return err; return err;
err = ds1307_add_frequency_test(ds1307); err = rtc_register_device(ds1307->rtc);
if (err) if (err)
return err; return err;