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iio: doc: Describe scale attributes for event thresholds

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Signed-off-by: Martin Fuzzey <mfuzzey@parkeon.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
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Martin Fuzzey 2015-02-19 15:16:04 +01:00 committed by Jonathan Cameron
parent debf6d843e
commit d1bd4867b0
1 changed files with 18 additions and 0 deletions
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18
Documentation/ABI/testing/sysfs-bus-iio
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@ -661,6 +661,24 @@ Description:
value is in raw device units or in processed units (as _raw
and _input do on sysfs direct channel read attributes).
What: /sys/.../events/in_accel_scale
What: /sys/.../events/in_accel_peak_scale
What: /sys/.../events/in_anglvel_scale
What: /sys/.../events/in_magn_scale
What: /sys/.../events/in_rot_from_north_magnetic_scale
What: /sys/.../events/in_rot_from_north_true_scale
What: /sys/.../events/in_voltage_scale
What: /sys/.../events/in_voltage_supply_scale
What: /sys/.../events/in_temp_scale
What: /sys/.../events/in_illuminance_scale
What: /sys/.../events/in_proximity_scale
KernelVersion: 3.21
Contact: linux-iio@vger.kernel.org
Description:
Specifies the conversion factor from the standard units
to device specific units used to set the event trigger
threshold.
What: /sys/.../events/in_accel_x_thresh_rising_hysteresis
What: /sys/.../events/in_accel_x_thresh_falling_hysteresis
What: /sys/.../events/in_accel_x_thresh_either_hysteresis