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staging:iio: Support functions for scan mask matching

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Signed-off-by: Jonathan Cameron <jic23@cam.ac.uk>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
This commit is contained in:
Jonathan Cameron 2010-05-04 14:42:59 +01:00 committed by Greg Kroah-Hartman
parent f3fb001191
commit e5c003ae82
1 changed files with 41 additions and 4 deletions
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45
drivers/staging/iio/iio.h
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@ -96,6 +96,7 @@ void iio_remove_event_from_list(struct iio_event_handler_list *el,
* control method is used * control method is used
* @scan_count: [INTERN] the number of elements in the current scan mode * @scan_count: [INTERN] the number of elements in the current scan mode
* @scan_mask: [INTERN] bitmask used in masking scan mode elements * @scan_mask: [INTERN] bitmask used in masking scan mode elements
* @available_scan_masks: [DRIVER] optional array of allowed bitmasks
* @scan_timestamp: [INTERN] does the scan mode include a timestamp * @scan_timestamp: [INTERN] does the scan mode include a timestamp
* @trig: [INTERN] current device trigger (ring buffer modes) * @trig: [INTERN] current device trigger (ring buffer modes)
* @pollfunc: [DRIVER] function run on trigger being recieved * @pollfunc: [DRIVER] function run on trigger being recieved
@ -122,7 +123,8 @@ struct iio_dev {
struct attribute_group *scan_el_attrs; struct attribute_group *scan_el_attrs;
int scan_count; int scan_count;
u16 scan_mask; u32 scan_mask;
u32 *available_scan_masks;
bool scan_timestamp; bool scan_timestamp;
struct iio_trigger *trig; struct iio_trigger *trig;
struct iio_poll_func *pollfunc; struct iio_poll_func *pollfunc;
@ -132,22 +134,57 @@ struct iio_dev {
* These are mainly provided to allow for a change of implementation if a device * These are mainly provided to allow for a change of implementation if a device
* has a large number of scan elements * has a large number of scan elements
*/ */
#define IIO_MAX_SCAN_LENGTH 15 #define IIO_MAX_SCAN_LENGTH 31
/* note 0 used as error indicator as it doesn't make sense. */
static inline u32 iio_scan_mask_match(u32 *av_masks, u32 mask)
{
while (*av_masks) {
if (!(~*av_masks & mask))
return *av_masks;
av_masks++;
}
return 0;
}
static inline int iio_scan_mask_query(struct iio_dev *dev_info, int bit) static inline int iio_scan_mask_query(struct iio_dev *dev_info, int bit)
{ {
u32 mask;
if (bit > IIO_MAX_SCAN_LENGTH) if (bit > IIO_MAX_SCAN_LENGTH)
return -EINVAL; return -EINVAL;
if (!dev_info->scan_mask)
return 0;
if (dev_info->available_scan_masks)
mask = iio_scan_mask_match(dev_info->available_scan_masks,
dev_info->scan_mask);
else else
return !!(dev_info->scan_mask & (1 << bit)); mask = dev_info->scan_mask;
if (!mask)
return -EINVAL;
return !!(mask & (1 << bit));
}; };
static inline int iio_scan_mask_set(struct iio_dev *dev_info, int bit) static inline int iio_scan_mask_set(struct iio_dev *dev_info, int bit)
{ {
u32 mask;
u32 trialmask = dev_info->scan_mask | (1 << bit);
if (bit > IIO_MAX_SCAN_LENGTH) if (bit > IIO_MAX_SCAN_LENGTH)
return -EINVAL; return -EINVAL;
dev_info->scan_mask |= (1 << bit); if (dev_info->available_scan_masks) {
mask = iio_scan_mask_match(dev_info->available_scan_masks,
trialmask);
if (!mask)
return -EINVAL;
}
dev_info->scan_mask = trialmask;
dev_info->scan_count++; dev_info->scan_count++;
return 0; return 0;
}; };