Commit Graph

24 Commits

Author SHA1 Message Date
Robert Baldyga f310abb33b Documentation: usb: update usb-tools repository address
It seems that gitorious repository is no longer accessible, so we
replace it with address to active repository.

Signed-off-by: Robert Baldyga <r.baldyga@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-12-16 10:07:30 -06:00
Peter Chen df001894e3 Documentation: usb: gadget-testing: add description for depth of queue
Add both bulk and iso depth of queue for sourcesink.

Reviewed-by: Krzysztof Opasiak <k.opasiak@samsung.com>
Signed-off-by: Peter Chen <peter.chen@freescale.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-12-15 09:12:41 -06:00
Peter Chen f811a38300 doc: usb: gadget-testing: using the updated testusb.c
testusb.c at http://www.linux-usb.org/usbtest/ is out of date,
using the one at the kernel source folder.

Cc: <stable@vger.kernel.org>
Signed-off-by: Peter Chen <peter.chen@freescale.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-07-31 09:02:07 -05:00
Andrzej Pietrasiewicz d6d22922d9 usb: gadget: rndis: remove the limit of available rndis connections
RNDIS function has a limitation on the number of allowed instances.
So far it has been RNDIS_MAX_CONFIGS, which happens to be one.
In order to eliminate this kind of arbitrary limitation we should not
preallocate a predefined (RNDIS_MAX_CONFIGS) array of struct rndis_params
instances but instead allow allocating them on demand.

This patch allocates struct rndis_params on demand in rndis_register().
Coversly, the structure is free()'d in rndis_deregister().
If CONFIG_USB_GADGET_DEBUG_FILES is set, the proc files are created which
is the same behaviour as before, but the moment of creation is delayed
until struct rndis_params is actually allocated.

rnids_init() and rndis_exit() have nothing to do, so they are eliminated.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-05-07 13:47:17 -05:00
Peter Chen 4e39acab03 usb: Documentation: gadget-testing: fix parameter for capture channel mask
Fix the UAC2 parameter capture channel mask

Signed-off-by: Peter Chen <peter.chen@freescale.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-04-27 15:55:39 -05:00
Andrzej Pietrasiewicz ee1cd515e8 usb: gadget: printer: add configfs support
Add support for configfs interface so that f_printer can be used as a
component of usb gadgets composed with it.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-03-10 15:33:41 -05:00
Andrzej Pietrasiewicz 9c4f538bfa Documentation: usb: UVC function testing
Summary of how to test UVC function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:26 -06:00
Andrzej Pietrasiewicz 020c6f9348 Documentation: usb: UAC2 function testing
Summary of how to test UAC2 function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz dae0358694 Documentation: usb: UAC1 function testing
Summary of how to test UAC1 function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz 480a912be4 Documentation: usb: SOURCESINK function testing
Summary of how to test SOURCESINK function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz 4dfcec8a2f Documentation: usb: SERIAL function testing
Summary of how to test SERIAL function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz ddb722449c Documentation: usb: RNDIS function testing
Summary of how to test RNDIS function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz da2907d2b0 Documentation: usb: PHONET function testing
Summary of how to test PHONET function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz d81b85dcf1 Documentation: usb: OBEX function testing
Summary of how to test OBEX function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz 4d0fa79e0e Documentation: usb: NCM function testing
Summary of how to test NCM function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz 0d6be59a1d Documentation: usb: MIDI function testing
Summary of how to test MIDI function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz cdbe287d27 Documentation: usb: MASS STORAGE function testing
Summary of how to test MASS STORAGE function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz ec91aff763 Documentation: usb: LOOPBACK function testing
Summary of how to test LOOPBACK function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz f7e3c3cd24 Documentation: usb: HID function testing
Summary of how to test HID function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz 2c0f62f9e4 Documentation: usb: FFS function testing
Summary of how to test FFS (FunctionFS) function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:25 -06:00
Andrzej Pietrasiewicz 4ca560a6d3 Documentation: usb: EEM function testing
Summary of how to test EEM function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:24 -06:00
Andrzej Pietrasiewicz 7bfbc6e3fb Documentation: usb: ECM subset function testing
Summary of how to test ECM subset function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:24 -06:00
Andrzej Pietrasiewicz d5862ca6da Documentation: usb: ECM function testing
Summary of how to test ECM function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:24 -06:00
Andrzej Pietrasiewicz e38eb2c8cb Documentation: usb: ACM function testing
The newly added file will be used to provide descriptions of how to test
the functions of USB gadgets.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
2015-01-12 12:13:24 -06:00