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11 commits

Author SHA1 Message Date
Roel Kluin
c6f7e7beb9 mtd: tests: fix read buffer overflows 
Check whether index is within bounds before testing the element.

Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
 2009-09-04 09:40:17 +01:00
Hannes Eder
23d4249491 trivial: NULL noise: drivers/mtd/tests/mtd_*test.c 
Fix this sparse warnings:
  drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer

Signed-off-by: Hannes Eder <hannes@hanneseder.net>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: Jiri Kosina <jkosina@suse.cz>
 2009-03-30 15:22:04 +02:00
David Woodhouse
647b0d3854 [MTD] [TESTS] Fix some size_t printk format warnings 
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
 2009-01-05 16:31:03 +00:00
Artem Bityutskiy
9faa8153be MTD: add MTD tests to compilation 
Add MTD tests to Kconfig and Makefiles.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-10 17:00:44 +02:00
Artem Bityutskiy
4db451a764 MTD: tests: add mtd_torturetest 
This test is designed to work for very long time and it tries to
wear few eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-10 17:00:40 +02:00
Artem Bityutskiy
bf60862a58 MTD: tests: add mtd_subpagetest 
This tests makes sure sub-pages on NAND MTD device work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-08 13:56:14 +02:00
Artem Bityutskiy
7163cea15f MTD: tests: add mtd_stresstest 
This test just performs random operations on random eraseblocks.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-08 13:56:14 +02:00
Artem Bityutskiy
72069be936 MTD: tests: add mtd_speedtest 
This test examines I/O speed of the flash device.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-08 13:56:14 +02:00
Artem Bityutskiy
72091b6889 MTD: tests: add mtd_readtest 
A simple tests which reads whole MTD device one page at a time.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-08 13:56:14 +02:00
Artem Bityutskiy
e73f217439 MTD: tests: add mtd_pagetest 
This test checks that NAND pages read/write work fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-08 13:56:14 +02:00
Artem Bityutskiy
e3644da756 MTD: tests: add mtd_oobtest 
This test checks that OOB of a NAND MTD device works fine.

Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
 2008-12-08 13:56:13 +02:00