After commit b8a1a4cd5a ("i2c: Provide a temporary .probe_new()
call-back type"), all drivers being converted to .probe_new() and then
03c835f498 ("i2c: Switch .probe() to not take an id parameter") convert
back to (the new) .probe() to be able to eventually drop .probe_new() from
struct i2c_driver.
Signed-off-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de
Link: https://lore.kernel.org/r/20230505220218.1239542-1-u.kleine-koenig@pengutronix.de
Signed-off-by: Mark Brown <broonie@kernel.org
This follows on the change ("regulator: Set PROBE_PREFER_ASYNCHRONOUS
for drivers that existed in 4.14") but changes regulators didn't exist
in Linux 5.4 but did exist in Linux 5.10.
Signed-off-by: Douglas Anderson <dianders@chromium.org>
Link: https://lore.kernel.org/r/20230316125351.4.I01f21c98901641a009890590ddc1354c0f294e5e@changeid
Signed-off-by: Mark Brown <broonie@kernel.org>
Since commit 0166dc11be ("of: make CONFIG_OF user selectable"), it
is possible to test-build any driver which depends on OF on any
architecture by explicitly selecting OF. Therefore depending on
COMPILE_TEST as an alternative is no longer needed.
It is actually better to always build such drivers with OF enabled,
so that the test builds are closer to how each driver will actually be
built on its intended target. Building them without OF may not test
much as the compiler will optimize out potentially large parts of the
code. In the worst case, this could even pop false positive warnings.
Dropping COMPILE_TEST here improves the quality of our testing and
avoids wasting time on non-existent issues.
As a minor optimization, this also lets us drop several occurrences of
of_match_ptr(), __maybe_unused and some ifdef guarding, as we now know
what all of this will resolve to, we might as well save cpp some work.
Signed-off-by: Jean Delvare <jdelvare@suse.de>
Cc: Liam Girdwood <lgirdwood@gmail.com>
Cc: Mark Brown <broonie@kernel.org>
Cc: Icenowy Zheng <icenowy@aosc.io>
Link: https://lore.kernel.org/r/20221124144708.64371b98@endymion.delvare
Signed-off-by: Mark Brown <broonie@kernel.org>
According to the datasheet:
REGISTER DETAILS − 0x02 BUCK, BUCK_OUT is BIT0 ~ BIT7.
So vsel_mask for FAN53880_BUCK should be 0xFF.
Fixes: e6dea51e2d ("regulator: fan53880: Add initial support")
Signed-off-by: Axel Lin <axel.lin@ingics.com>
Link: https://lore.kernel.org/r/20210607142907.1599905-1-axel.lin@ingics.com
Signed-off-by: Mark Brown <broonie@kernel.org>
This patch adds support for COMPILE_TEST while fixing a warning when
no support for device tree is there.
Reported-by: kernel test robot <lkp@intel.com>
Signed-off-by: Christoph Fritz <chf.fritz@googlemail.com>
Link: https://lore.kernel.org/r/1c437154873ace65ff738a0ebca511308f1cecc1.camel@googlemail.com
Signed-off-by: Mark Brown <broonie@kernel.org>
This patch adds support for ON Semiconductor FAN53880 regulator.
The FAN53880 is an I2C porgrammable power management IC (PMIC)
that contains a BUCK (step-down converter), four LDOs (low dropouts)
and one BOOST (step-up converter). It is designed for mobile power
applications.
Signed-off-by: Christoph Fritz <chf.fritz@googlemail.com>
Link: https://lore.kernel.org/r/20200702210846.31659-2-chf.fritz@googlemail.com
Signed-off-by: Mark Brown <broonie@kernel.org>
