The AD74115H is a single-channel, software-configurable, input and
output device for industrial control applications. The AD74115H
provides a wide range of use cases, integrated on a single chip.
These use cases include analog output, analog input, digital output,
digital input, resistance temperature detector (RTD), and thermocouple
measurement capability. The AD74115H also has an integrated HART modem.
A serial peripheral interface (SPI) is used to handle all communications
to the device, including communications with the HART modem. The digital
input and digital outputs can be accessed via the SPI or the
general-purpose input and output (GPIO) pins to support higher
speed data rates.
The device features a 16-bit, sigma-delta analog-to-digital converter
(ADC) and a 14-bit digital-to-analog converter (DAC).
The AD74115H contains a high accuracy 2.5 V on-chip reference that can
be used as the DAC and ADC reference.
Signed-off-by: Cosmin Tanislav <cosmin.tanislav@analog.com>
Reviewed-by: Linus Walleij <linus.walleij@linaro.org>
Link: https://lore.kernel.org/r/20221117080916.411766-3-cosmin.tanislav@analog.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
The AD74412R and AD74413R are quad-channel, software configurable,
input/output solutions for building and process control applications.
They contain functionality for analog output, analog input, digital input,
resistance temperature detector, and thermocouple measurements integrated
into a single chip solution with an SPI interface.
The devices feature a 16-bit ADC and four configurable 13-bit DACs to
provide four configurable input/output channels and a suite of diagnostic
functions.
The AD74413R differentiates itself from the AD74412R by being
HART-compatible.
When configured with channel 0 as voltage output, channel 1 as current
output, channel 2 as voltage input and channel 3 as current input, the
following structure is created under the corresponding IIO device.
.
├── in_current0_offset
├── in_current0_raw
├── in_current0_sampling_frequency
├── in_current0_sampling_frequency_available
├── in_current0_scale
├── in_voltage1_offset
├── in_voltage1_raw
├── in_voltage1_sampling_frequency
├── in_voltage1_sampling_frequency_available
├── in_voltage1_scale
├── in_voltage2_offset
├── in_voltage2_raw
├── in_voltage2_sampling_frequency
├── in_voltage2_sampling_frequency_available
├── in_voltage2_scale
├── in_current3_offset
├── in_current3_raw
├── in_current3_sampling_frequency
├── in_current3_sampling_frequency_available
├── in_current3_scale
├── out_voltage0_raw
├── out_voltage0_scale
├── out_current1_raw
├── out_current1_scale
├── name
├── buffer
│ ├── data_available
│ ├── enable
│ ├── length
│ └── watermark
└── scan_elements
├── in_current0_en
├── in_current0_index
├── in_current0_type
├── in_voltage1_en
├── in_voltage1_index
├── in_voltage1_type
├── in_voltage2_en
├── in_voltage2_index
├── in_voltage2_type
├── in_current3_en
├── in_current3_index
└── in_current3_type
Signed-off-by: Cosmin Tanislav <cosmin.tanislav@analog.com>
Reviewed-by: Linus Walleij <linus.walleij@linaro.org>
Link: https://lore.kernel.org/r/20211205114045.173612-4-cosmin.tanislav@analog.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
