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d92e244322
In order to build-test the same unit-test files using fdtoverlay tool, move the device nodes from the existing overlay_base.dts and testcases_common.dts files to .dtsi counterparts. The .dts files now include the new .dtsi files, resulting in exactly the same behavior as earlier. The .dtsi files can now be reused for compile time tests using fdtoverlay (will be done by a later commit). This is required because the base files passed to fdtoverlay tool shouldn't be overlays themselves (i.e. shouldn't have the /plugin/; tag). Note that this commit also moves "testcase-device2" node to testcases.dts from tests-interrupts.dtsi, as this node has a deliberate error in it and is only relevant for runtime testing done with unittest.c. Signed-off-by: Viresh Kumar <viresh.kumar@linaro.org> Reviewed-by: Frank Rowand <frank.rowand@sony.com> Tested-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org> Link: https://lore.kernel.org/r/c3354a042ba34a03fd563061cbaa7fc96cb2d71a.1615354376.git.viresh.kumar@linaro.org
71 lines
1.5 KiB
Text
71 lines
1.5 KiB
Text
// SPDX-License-Identifier: GPL-2.0
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/ {
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testcase-data {
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interrupts {
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#address-cells = <1>;
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#size-cells = <1>;
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test_intc0: intc0 {
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interrupt-controller;
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#interrupt-cells = <1>;
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};
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test_intc1: intc1 {
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interrupt-controller;
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#interrupt-cells = <3>;
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};
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test_intc2: intc2 {
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interrupt-controller;
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#interrupt-cells = <2>;
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};
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test_intmap0: intmap0 {
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#interrupt-cells = <1>;
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#address-cells = <0>;
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interrupt-map = <1 &test_intc0 9>,
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<2 &test_intc1 10 11 12>,
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<3 &test_intc2 13 14>,
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<4 &test_intc2 15 16>;
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};
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test_intmap1: intmap1 {
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#interrupt-cells = <2>;
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interrupt-map = <0x5000 1 2 &test_intc0 15>;
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};
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interrupts0 {
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interrupt-parent = <&test_intc0>;
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interrupts = <1>, <2>, <3>, <4>;
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};
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interrupts1 {
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interrupt-parent = <&test_intmap0>;
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interrupts = <1>, <2>, <3>, <4>;
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};
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interrupts-extended0 {
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reg = <0x5000 0x100>;
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interrupts-extended = <&test_intc0 1>,
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<&test_intc1 2 3 4>,
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<&test_intc2 5 6>,
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<&test_intmap0 1>,
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<&test_intmap0 2>,
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<&test_intmap0 3>,
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<&test_intmap1 1 2>;
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};
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};
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testcase-device1 {
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compatible = "testcase-device";
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interrupt-parent = <&test_intc0>;
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interrupts = <1>;
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};
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/*
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* testcase data that intentionally results in an error is
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* located in testcases.dts instead of in this file so that the
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* static overlay apply tests will not include the error.
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*/
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};
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};
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