linux-stable/drivers/gpu/drm/i915/selftests/i915_selftest.c

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drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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/*
* Copyright © 2016 Intel Corporation
*
* Permission is hereby granted, free of charge, to any person obtaining a
* copy of this software and associated documentation files (the "Software"),
* to deal in the Software without restriction, including without limitation
* the rights to use, copy, modify, merge, publish, distribute, sublicense,
* and/or sell copies of the Software, and to permit persons to whom the
* Software is furnished to do so, subject to the following conditions:
*
* The above copyright notice and this permission notice (including the next
* paragraph) shall be included in all copies or substantial portions of the
* Software.
*
* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
* THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
* LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING
* FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS
* IN THE SOFTWARE.
*/
#include <linux/random.h>
#include "gt/intel_gt_pm.h"
#include "i915_drv.h"
#include "i915_selftest.h"
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#include "igt_flush_test.h"
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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struct i915_selftest i915_selftest __read_mostly = {
.timeout_ms = 500,
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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};
int i915_mock_sanitycheck(void)
{
pr_info(DRIVER_NAME ": %s() - ok!\n", __func__);
return 0;
}
int i915_live_sanitycheck(struct drm_i915_private *i915)
{
pr_info("%s: %s() - ok!\n", i915->drm.driver->name, __func__);
return 0;
}
enum {
#define selftest(name, func) mock_##name,
#include "i915_mock_selftests.h"
#undef selftest
};
enum {
#define selftest(name, func) live_##name,
#include "i915_live_selftests.h"
#undef selftest
};
enum {
#define selftest(name, func) perf_##name,
#include "i915_perf_selftests.h"
#undef selftest
};
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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struct selftest {
bool enabled;
const char *name;
union {
int (*mock)(void);
int (*live)(struct drm_i915_private *);
};
};
#define selftest(n, f) [mock_##n] = { .name = #n, { .mock = f } },
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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static struct selftest mock_selftests[] = {
#include "i915_mock_selftests.h"
};
#undef selftest
#define selftest(n, f) [live_##n] = { .name = #n, { .live = f } },
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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static struct selftest live_selftests[] = {
#include "i915_live_selftests.h"
};
#undef selftest
#define selftest(n, f) [perf_##n] = { .name = #n, { .live = f } },
static struct selftest perf_selftests[] = {
#include "i915_perf_selftests.h"
};
#undef selftest
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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/* Embed the line number into the parameter name so that we can order tests */
#define selftest(n, func) selftest_0(n, func, param(n))
#define param(n) __PASTE(igt__, __PASTE(__LINE__, __mock_##n))
#define selftest_0(n, func, id) \
module_param_named(id, mock_selftests[mock_##n].enabled, bool, 0400);
#include "i915_mock_selftests.h"
#undef selftest_0
#undef param
#define param(n) __PASTE(igt__, __PASTE(__LINE__, __live_##n))
#define selftest_0(n, func, id) \
module_param_named(id, live_selftests[live_##n].enabled, bool, 0400);
#include "i915_live_selftests.h"
#undef selftest_0
#undef param
#define param(n) __PASTE(igt__, __PASTE(__LINE__, __perf_##n))
#define selftest_0(n, func, id) \
module_param_named(id, perf_selftests[perf_##n].enabled, bool, 0400);
#include "i915_perf_selftests.h"
#undef selftest_0
#undef param
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#undef selftest
static void set_default_test_all(struct selftest *st, unsigned int count)
{
unsigned int i;
for (i = 0; i < count; i++)
if (st[i].enabled)
return;
for (i = 0; i < count; i++)
st[i].enabled = true;
}
static int __run_selftests(const char *name,
struct selftest *st,
unsigned int count,
void *data)
{
int err = 0;
while (!i915_selftest.random_seed)
i915_selftest.random_seed = get_random_int();
i915_selftest.timeout_jiffies =
i915_selftest.timeout_ms ?
msecs_to_jiffies_timeout(i915_selftest.timeout_ms) :
MAX_SCHEDULE_TIMEOUT;
set_default_test_all(st, count);
pr_info(DRIVER_NAME ": Performing %s selftests with st_random_seed=0x%x st_timeout=%u\n",
name, i915_selftest.random_seed, i915_selftest.timeout_ms);
/* Tests are listed in order in i915_*_selftests.h */
for (; count--; st++) {
if (!st->enabled)
continue;
cond_resched();
if (signal_pending(current))
return -EINTR;
pr_info(DRIVER_NAME ": Running %s\n", st->name);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
if (data)
err = st->live(data);
else
err = st->mock();
if (err == -EINTR && !signal_pending(current))
err = 0;
if (err)
break;
}
if (WARN(err > 0 || err == -ENOTTY,
"%s returned %d, conflicting with selftest's magic values!\n",
st->name, err))
err = -1;
return err;
}
#define run_selftests(x, data) \
__run_selftests(#x, x##_selftests, ARRAY_SIZE(x##_selftests), data)
int i915_mock_selftests(void)
{
int err;
if (!i915_selftest.mock)
return 0;
err = run_selftests(mock, NULL);
if (err) {
i915_selftest.mock = err;
return err;
}
if (i915_selftest.mock < 0) {
i915_selftest.mock = -ENOTTY;
return 1;
}
return 0;
}
int i915_live_selftests(struct pci_dev *pdev)
{
int err;
if (!i915_selftest.live)
return 0;
err = run_selftests(live, pdev_to_i915(pdev));
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
if (err) {
i915_selftest.live = err;
return err;
}
if (i915_selftest.live < 0) {
i915_selftest.live = -ENOTTY;
return 1;
}
return 0;
}
int i915_perf_selftests(struct pci_dev *pdev)
{
int err;
if (!i915_selftest.perf)
return 0;
err = run_selftests(perf, pdev_to_i915(pdev));
if (err) {
i915_selftest.perf = err;
return err;
}
if (i915_selftest.perf < 0) {
i915_selftest.perf = -ENOTTY;
return 1;
}
return 0;
}
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-29 18:54:49 +00:00
static bool apply_subtest_filter(const char *caller, const char *name)
{
char *filter, *sep, *tok;
bool result = true;
filter = kstrdup(i915_selftest.filter, GFP_KERNEL);
for (sep = filter; (tok = strsep(&sep, ","));) {
bool allow = true;
char *sl;
if (*tok == '!') {
allow = false;
tok++;
}
if (*tok == '\0')
continue;
sl = strchr(tok, '/');
if (sl) {
*sl++ = '\0';
if (strcmp(tok, caller)) {
if (allow)
result = false;
continue;
}
tok = sl;
}
if (strcmp(tok, name)) {
if (allow)
result = false;
continue;
}
result = allow;
break;
}
kfree(filter);
return result;
}
int __i915_nop_setup(void *data)
{
return 0;
}
int __i915_nop_teardown(int err, void *data)
{
return err;
}
int __i915_live_setup(void *data)
{
struct drm_i915_private *i915 = data;
/* The selftests expect an idle system */
if (intel_gt_pm_wait_for_idle(&i915->gt))
return -EIO;
return intel_gt_terminally_wedged(&i915->gt);
}
int __i915_live_teardown(int err, void *data)
{
struct drm_i915_private *i915 = data;
if (igt_flush_test(i915))
err = -EIO;
i915_gem_drain_freed_objects(i915);
return err;
}
int __intel_gt_live_setup(void *data)
{
struct intel_gt *gt = data;
/* The selftests expect an idle system */
if (intel_gt_pm_wait_for_idle(gt))
return -EIO;
return intel_gt_terminally_wedged(gt);
}
int __intel_gt_live_teardown(int err, void *data)
{
struct intel_gt *gt = data;
if (igt_flush_test(gt->i915))
err = -EIO;
i915_gem_drain_freed_objects(gt->i915);
return err;
}
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
int __i915_subtests(const char *caller,
int (*setup)(void *data),
int (*teardown)(int err, void *data),
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
const struct i915_subtest *st,
unsigned int count,
void *data)
{
int err;
for (; count--; st++) {
cond_resched();
if (signal_pending(current))
return -EINTR;
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-29 18:54:49 +00:00
if (!apply_subtest_filter(caller, st->name))
continue;
err = setup(data);
if (err) {
pr_err(DRIVER_NAME "/%s: setup failed for %s\n",
caller, st->name);
return err;
}
pr_info(DRIVER_NAME ": Running %s/%s\n", caller, st->name);
GEM_TRACE("Running %s/%s\n", caller, st->name);
err = teardown(st->func(data), data);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
if (err && err != -EINTR) {
pr_err(DRIVER_NAME "/%s: %s failed with error %d\n",
caller, st->name, err);
return err;
}
}
return 0;
}
bool __igt_timeout(unsigned long timeout, const char *fmt, ...)
{
va_list va;
if (!signal_pending(current)) {
cond_resched();
if (time_before(jiffies, timeout))
return false;
}
if (fmt) {
va_start(va, fmt);
vprintk(fmt, va);
va_end(va);
}
return true;
}
void igt_hexdump(const void *buf, size_t len)
{
const size_t rowsize = 8 * sizeof(u32);
const void *prev = NULL;
bool skip = false;
size_t pos;
for (pos = 0; pos < len; pos += rowsize) {
char line[128];
if (prev && !memcmp(prev, buf + pos, rowsize)) {
if (!skip) {
pr_info("*\n");
skip = true;
}
continue;
}
WARN_ON_ONCE(hex_dump_to_buffer(buf + pos, len - pos,
rowsize, sizeof(u32),
line, sizeof(line),
false) >= sizeof(line));
pr_info("[%04zx] %s\n", pos, line);
prev = buf + pos;
skip = false;
}
}
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
module_param_named(st_random_seed, i915_selftest.random_seed, uint, 0400);
module_param_named(st_timeout, i915_selftest.timeout_ms, uint, 0400);
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-29 18:54:49 +00:00
module_param_named(st_filter, i915_selftest.filter, charp, 0400);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
module_param_named_unsafe(mock_selftests, i915_selftest.mock, int, 0400);
MODULE_PARM_DESC(mock_selftests, "Run selftests before loading, using mock hardware (0:disabled [default], 1:run tests then load driver, -1:run tests then exit module)");
module_param_named_unsafe(live_selftests, i915_selftest.live, int, 0400);
MODULE_PARM_DESC(live_selftests, "Run selftests after driver initialisation on the live system (0:disabled [default], 1:run tests then continue, -1:run tests then exit module)");
module_param_named_unsafe(perf_selftests, i915_selftest.perf, int, 0400);
MODULE_PARM_DESC(perf_selftests, "Run performance orientated selftests after driver initialisation on the live system (0:disabled [default], 1:run tests then continue, -1:run tests then exit module)");