linux-stable/drivers/gpu/drm/i915/selftests/i915_selftest.c

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drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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/*
* Copyright © 2016 Intel Corporation
*
* Permission is hereby granted, free of charge, to any person obtaining a
* copy of this software and associated documentation files (the "Software"),
* to deal in the Software without restriction, including without limitation
* the rights to use, copy, modify, merge, publish, distribute, sublicense,
* and/or sell copies of the Software, and to permit persons to whom the
* Software is furnished to do so, subject to the following conditions:
*
* The above copyright notice and this permission notice (including the next
* paragraph) shall be included in all copies or substantial portions of the
* Software.
*
* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
* THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
* LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING
* FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS
* IN THE SOFTWARE.
*/
#include <linux/random.h>
#include "gt/intel_gt_pm.h"
#include "i915_driver.h"
#include "i915_drv.h"
#include "i915_selftest.h"
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#include "igt_flush_test.h"
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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struct i915_selftest i915_selftest __read_mostly = {
.timeout_ms = 500,
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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};
int i915_mock_sanitycheck(void)
{
pr_info(DRIVER_NAME ": %s() - ok!\n", __func__);
return 0;
}
int i915_live_sanitycheck(struct drm_i915_private *i915)
{
pr_info("%s: %s() - ok!\n", i915->drm.driver->name, __func__);
return 0;
}
enum {
#define selftest(name, func) mock_##name,
#include "i915_mock_selftests.h"
#undef selftest
};
enum {
#define selftest(name, func) live_##name,
#include "i915_live_selftests.h"
#undef selftest
};
enum {
#define selftest(name, func) perf_##name,
#include "i915_perf_selftests.h"
#undef selftest
};
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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struct selftest {
bool enabled;
const char *name;
union {
int (*mock)(void);
int (*live)(struct drm_i915_private *);
};
};
#define selftest(n, f) [mock_##n] = { .name = #n, { .mock = f } },
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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static struct selftest mock_selftests[] = {
#include "i915_mock_selftests.h"
};
#undef selftest
#define selftest(n, f) [live_##n] = { .name = #n, { .live = f } },
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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static struct selftest live_selftests[] = {
#include "i915_live_selftests.h"
};
#undef selftest
#define selftest(n, f) [perf_##n] = { .name = #n, { .live = f } },
static struct selftest perf_selftests[] = {
#include "i915_perf_selftests.h"
};
#undef selftest
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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/* Embed the line number into the parameter name so that we can order tests */
#define selftest(n, func) selftest_0(n, func, param(n))
#define param(n) __PASTE(igt__, __PASTE(__LINE__, __mock_##n))
#define selftest_0(n, func, id) \
module_param_named(id, mock_selftests[mock_##n].enabled, bool, 0400);
#include "i915_mock_selftests.h"
#undef selftest_0
#undef param
#define param(n) __PASTE(igt__, __PASTE(__LINE__, __live_##n))
#define selftest_0(n, func, id) \
module_param_named(id, live_selftests[live_##n].enabled, bool, 0400);
#include "i915_live_selftests.h"
#undef selftest_0
#undef param
#define param(n) __PASTE(igt__, __PASTE(__LINE__, __perf_##n))
#define selftest_0(n, func, id) \
module_param_named(id, perf_selftests[perf_##n].enabled, bool, 0400);
#include "i915_perf_selftests.h"
#undef selftest_0
#undef param
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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#undef selftest
static void set_default_test_all(struct selftest *st, unsigned int count)
{
unsigned int i;
for (i = 0; i < count; i++)
if (st[i].enabled)
return;
for (i = 0; i < count; i++)
st[i].enabled = true;
}
static int __run_selftests(const char *name,
struct selftest *st,
unsigned int count,
void *data)
{
int err = 0;
while (!i915_selftest.random_seed)
i915_selftest.random_seed = get_random_u32();
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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i915_selftest.timeout_jiffies =
i915_selftest.timeout_ms ?
msecs_to_jiffies_timeout(i915_selftest.timeout_ms) :
MAX_SCHEDULE_TIMEOUT;
set_default_test_all(st, count);
pr_info(DRIVER_NAME ": Performing %s selftests with st_random_seed=0x%x st_timeout=%u\n",
name, i915_selftest.random_seed, i915_selftest.timeout_ms);
/* Tests are listed in order in i915_*_selftests.h */
for (; count--; st++) {
if (!st->enabled)
continue;
cond_resched();
if (signal_pending(current))
return -EINTR;
pr_info(DRIVER_NAME ": Running %s\n", st->name);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
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if (data)
err = st->live(data);
else
err = st->mock();
if (err == -EINTR && !signal_pending(current))
err = 0;
if (err)
break;
}
if (WARN(err > 0 || err == -ENOTTY,
"%s returned %d, conflicting with selftest's magic values!\n",
st->name, err))
err = -1;
return err;
}
#define run_selftests(x, data) \
__run_selftests(#x, x##_selftests, ARRAY_SIZE(x##_selftests), data)
int i915_mock_selftests(void)
{
int err;
if (!i915_selftest.mock)
return 0;
err = run_selftests(mock, NULL);
if (err) {
i915_selftest.mock = err;
drm/i915: Use a table for i915_init/exit (v2) If the driver was not fully loaded, we may still have globals lying around. If we don't tear those down in i915_exit(), we'll leak a bunch of memory slabs. This can happen two ways: use_kms = false and if we've run mock selftests. In either case, we have an early exit from i915_init which happens after i915_globals_init() and we need to clean up those globals. The mock selftests case is especially sticky. The load isn't entirely a no-op. We actually do quite a bit inside those selftests including allocating a bunch of mock objects and running tests on them. Once all those tests are complete, we exit early from i915_init(). Perviously, i915_init() would return a non-zero error code on failure and a zero error code on success. In the success case, we would get to i915_exit() and check i915_pci_driver.driver.owner to detect if i915_init exited early and do nothing. In the failure case, we would fail i915_init() but there would be no opportunity to clean up globals. The most annoying part is that you don't actually notice the failure as part of the self-tests since leaking a bit of memory, while bad, doesn't result in anything observable from userspace. Instead, the next time we load the driver (usually for next IGT test), i915_globals_init() gets invoked again, we go to allocate a bunch of new memory slabs, those implicitly create debugfs entries, and debugfs warns that we're trying to create directories and files that already exist. Since this all happens as part of the next driver load, it shows up in the dmesg-warn of whatever IGT test ran after the mock selftests. While the obvious thing to do here might be to call i915_globals_exit() after selftests, that's not actually safe. The dma-buf selftests call i915_gem_prime_export which creates a file. We call dma_buf_put() on the resulting dmabuf which calls fput() on the file. However, fput() isn't immediate and gets flushed right before syscall returns. This means that all the fput()s from the selftests don't happen until right before the module load syscall used to fire off the selftests returns which is after i915_init(). If we call i915_globals_exit() in i915_init() after selftests, we end up freeing slabs out from under objects which won't get released until fput() is flushed at the end of the module load syscall. The solution here is to let i915_init() return success early and detect the early success in i915_exit() and only tear down globals and nothing else. This way the module loads successfully, regardless of the success or failure of the tests. Because we've not enumerated any PCI devices, no device nodes are created and it's entirely useless from userspace. The only thing the module does at that point is hold on to a bit of memory until we unload it and i915_exit() is called. Importantly, this means that everything from our selftests has the ability to properly flush out between i915_init() and i915_exit() because there is at least one syscall boundary in between. In order to handle all the delicate init/exit cases, we convert the whole thing to a table of init/exit pairs and track the init status in the new init_progress global. This allows us to ensure that i915_exit() always tears down exactly the things that i915_init() successfully initialized. We also allow early-exit of i915_init() without failure by an init function returning > 0. This is useful for nomodeset, and selftests. For the mock selftests, we convert them to always return 1 so we get the desired behavior of the driver always succeeding to load the driver and then properly tearing down the partially loaded driver. v2 (Tvrtko Ursulin): - Guard init_funcs[i].exit with GEM_BUG_ON(i >= ARRAY_SIZE(init_funcs)) v2 (Daniel Vetter): - Update the docstring for i915.mock_selftests Signed-off-by: Jason Ekstrand <jason@jlekstrand.net> Reviewed-by: Daniel Vetter <daniel.vetter@ffwll.ch> Cc: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Signed-off-by: Daniel Vetter <daniel.vetter@ffwll.ch> Link: https://patchwork.freedesktop.org/patch/msgid/20210721152358.2893314-4-jason@jlekstrand.net
2021-07-21 15:23:55 +00:00
return 1;
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
}
if (i915_selftest.mock < 0) {
i915_selftest.mock = -ENOTTY;
return 1;
}
return 0;
}
int i915_live_selftests(struct pci_dev *pdev)
{
int err;
if (!i915_selftest.live)
return 0;
err = run_selftests(live, pdev_to_i915(pdev));
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
if (err) {
i915_selftest.live = err;
return err;
}
if (i915_selftest.live < 0) {
i915_selftest.live = -ENOTTY;
return 1;
}
return 0;
}
int i915_perf_selftests(struct pci_dev *pdev)
{
int err;
if (!i915_selftest.perf)
return 0;
err = run_selftests(perf, pdev_to_i915(pdev));
if (err) {
i915_selftest.perf = err;
return err;
}
if (i915_selftest.perf < 0) {
i915_selftest.perf = -ENOTTY;
return 1;
}
return 0;
}
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-29 18:54:49 +00:00
static bool apply_subtest_filter(const char *caller, const char *name)
{
char *filter, *sep, *tok;
bool result = true;
filter = kstrdup(i915_selftest.filter, GFP_KERNEL);
for (sep = filter; (tok = strsep(&sep, ","));) {
bool allow = true;
char *sl;
if (*tok == '!') {
allow = false;
tok++;
}
if (*tok == '\0')
continue;
sl = strchr(tok, '/');
if (sl) {
*sl++ = '\0';
if (strcmp(tok, caller)) {
if (allow)
result = false;
continue;
}
tok = sl;
}
if (strcmp(tok, name)) {
if (allow)
result = false;
continue;
}
result = allow;
break;
}
kfree(filter);
return result;
}
int __i915_nop_setup(void *data)
{
return 0;
}
int __i915_nop_teardown(int err, void *data)
{
return err;
}
int __i915_live_setup(void *data)
{
struct drm_i915_private *i915 = data;
/* The selftests expect an idle system */
if (intel_gt_pm_wait_for_idle(to_gt(i915)))
return -EIO;
return intel_gt_terminally_wedged(to_gt(i915));
}
int __i915_live_teardown(int err, void *data)
{
struct drm_i915_private *i915 = data;
if (igt_flush_test(i915))
err = -EIO;
i915_gem_drain_freed_objects(i915);
return err;
}
int __intel_gt_live_setup(void *data)
{
struct intel_gt *gt = data;
/* The selftests expect an idle system */
if (intel_gt_pm_wait_for_idle(gt))
return -EIO;
return intel_gt_terminally_wedged(gt);
}
int __intel_gt_live_teardown(int err, void *data)
{
struct intel_gt *gt = data;
if (igt_flush_test(gt->i915))
err = -EIO;
i915_gem_drain_freed_objects(gt->i915);
return err;
}
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
int __i915_subtests(const char *caller,
int (*setup)(void *data),
int (*teardown)(int err, void *data),
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
const struct i915_subtest *st,
unsigned int count,
void *data)
{
int err;
for (; count--; st++) {
cond_resched();
if (signal_pending(current))
return -EINTR;
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-29 18:54:49 +00:00
if (!apply_subtest_filter(caller, st->name))
continue;
err = setup(data);
if (err) {
pr_err(DRIVER_NAME "/%s: setup failed for %s\n",
caller, st->name);
return err;
}
pr_info(DRIVER_NAME ": Running %s/%s\n", caller, st->name);
GEM_TRACE("Running %s/%s\n", caller, st->name);
err = teardown(st->func(data), data);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
if (err && err != -EINTR) {
pr_err(DRIVER_NAME "/%s: %s failed with error %d\n",
caller, st->name, err);
return err;
}
}
return 0;
}
bool __igt_timeout(unsigned long timeout, const char *fmt, ...)
{
va_list va;
if (!signal_pending(current)) {
cond_resched();
if (time_before(jiffies, timeout))
return false;
}
if (fmt) {
va_start(va, fmt);
vprintk(fmt, va);
va_end(va);
}
return true;
}
void igt_hexdump(const void *buf, size_t len)
{
const size_t rowsize = 8 * sizeof(u32);
const void *prev = NULL;
bool skip = false;
size_t pos;
for (pos = 0; pos < len; pos += rowsize) {
char line[128];
if (prev && !memcmp(prev, buf + pos, rowsize)) {
if (!skip) {
pr_info("*\n");
skip = true;
}
continue;
}
WARN_ON_ONCE(hex_dump_to_buffer(buf + pos, len - pos,
rowsize, sizeof(u32),
line, sizeof(line),
false) >= sizeof(line));
pr_info("[%04zx] %s\n", pos, line);
prev = buf + pos;
skip = false;
}
}
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
module_param_named(st_random_seed, i915_selftest.random_seed, uint, 0400);
module_param_named(st_timeout, i915_selftest.timeout_ms, uint, 0400);
drm/i915/selftests: Apply a subtest filter In bringup on simulated HW even rudimentary tests are slow, and so many may fail that we want to be able to filter out the noise to focus on the specific problem. Even just the tests groups provided for igt is not specific enough, and we would like to isolate one particular subtest (and probably subsubtests!). For simplicity, allow the user to provide a command line parameter such as i915.st_filter=i915_timeline_mock_selftests/igt_sync to restrict ourselves to only running on subtest. The exact name to use is given during a normal run, highlighted as an error if it failed, debug otherwise. The test group is optional, and then all subtests are compared for an exact match with the filter (most subtests have unique names). The filter can be negated, e.g. i915.st_filter=!igt_sync and then all tests but those that match will be run. More than one match can be supplied separated by a comma, e.g. i915.st_filter=igt_vma_create,igt_vma_pin1 to only run those specified, or i915.st_filter=!igt_vma_create,!igt_vma_pin1 to run all but those named. Mixing a blacklist and whitelist will only execute those subtests matching the whitelist so long as they are previously excluded in the blacklist. Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Cc: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Reviewed-by: Joonas Lahtinen <joonas.lahtinen@linux.intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20190129185452.20989-1-chris@chris-wilson.co.uk
2019-01-29 18:54:49 +00:00
module_param_named(st_filter, i915_selftest.filter, charp, 0400);
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
module_param_named_unsafe(mock_selftests, i915_selftest.mock, int, 0400);
drm/i915: Use a table for i915_init/exit (v2) If the driver was not fully loaded, we may still have globals lying around. If we don't tear those down in i915_exit(), we'll leak a bunch of memory slabs. This can happen two ways: use_kms = false and if we've run mock selftests. In either case, we have an early exit from i915_init which happens after i915_globals_init() and we need to clean up those globals. The mock selftests case is especially sticky. The load isn't entirely a no-op. We actually do quite a bit inside those selftests including allocating a bunch of mock objects and running tests on them. Once all those tests are complete, we exit early from i915_init(). Perviously, i915_init() would return a non-zero error code on failure and a zero error code on success. In the success case, we would get to i915_exit() and check i915_pci_driver.driver.owner to detect if i915_init exited early and do nothing. In the failure case, we would fail i915_init() but there would be no opportunity to clean up globals. The most annoying part is that you don't actually notice the failure as part of the self-tests since leaking a bit of memory, while bad, doesn't result in anything observable from userspace. Instead, the next time we load the driver (usually for next IGT test), i915_globals_init() gets invoked again, we go to allocate a bunch of new memory slabs, those implicitly create debugfs entries, and debugfs warns that we're trying to create directories and files that already exist. Since this all happens as part of the next driver load, it shows up in the dmesg-warn of whatever IGT test ran after the mock selftests. While the obvious thing to do here might be to call i915_globals_exit() after selftests, that's not actually safe. The dma-buf selftests call i915_gem_prime_export which creates a file. We call dma_buf_put() on the resulting dmabuf which calls fput() on the file. However, fput() isn't immediate and gets flushed right before syscall returns. This means that all the fput()s from the selftests don't happen until right before the module load syscall used to fire off the selftests returns which is after i915_init(). If we call i915_globals_exit() in i915_init() after selftests, we end up freeing slabs out from under objects which won't get released until fput() is flushed at the end of the module load syscall. The solution here is to let i915_init() return success early and detect the early success in i915_exit() and only tear down globals and nothing else. This way the module loads successfully, regardless of the success or failure of the tests. Because we've not enumerated any PCI devices, no device nodes are created and it's entirely useless from userspace. The only thing the module does at that point is hold on to a bit of memory until we unload it and i915_exit() is called. Importantly, this means that everything from our selftests has the ability to properly flush out between i915_init() and i915_exit() because there is at least one syscall boundary in between. In order to handle all the delicate init/exit cases, we convert the whole thing to a table of init/exit pairs and track the init status in the new init_progress global. This allows us to ensure that i915_exit() always tears down exactly the things that i915_init() successfully initialized. We also allow early-exit of i915_init() without failure by an init function returning > 0. This is useful for nomodeset, and selftests. For the mock selftests, we convert them to always return 1 so we get the desired behavior of the driver always succeeding to load the driver and then properly tearing down the partially loaded driver. v2 (Tvrtko Ursulin): - Guard init_funcs[i].exit with GEM_BUG_ON(i >= ARRAY_SIZE(init_funcs)) v2 (Daniel Vetter): - Update the docstring for i915.mock_selftests Signed-off-by: Jason Ekstrand <jason@jlekstrand.net> Reviewed-by: Daniel Vetter <daniel.vetter@ffwll.ch> Cc: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Signed-off-by: Daniel Vetter <daniel.vetter@ffwll.ch> Link: https://patchwork.freedesktop.org/patch/msgid/20210721152358.2893314-4-jason@jlekstrand.net
2021-07-21 15:23:55 +00:00
MODULE_PARM_DESC(mock_selftests, "Run selftests before loading, using mock hardware (0:disabled [default], 1:run tests then load driver, -1:run tests then leave dummy module)");
drm/i915: Provide a hook for selftests Some pieces of code are independent of hardware but are very tricky to exercise through the normal userspace ABI or via debugfs hooks. Being able to create mock unit tests and execute them through CI is vital. Start by adding a central point where we can execute unit tests and a parameter to enable them. This is disabled by default as the expectation is that these tests will occasionally explode. To facilitate integration with igt, any parameter beginning with i915.igt__ is interpreted as a subtest executable independently via igt/drv_selftest. Two classes of selftests are recognised: mock unit tests and integration tests. Mock unit tests are run as soon as the module is loaded, before the device is probed. At that point there is no driver instantiated and all hw interactions must be "mocked". This is very useful for writing universal tests to exercise code not typically run on a broad range of architectures. Alternatively, you can hook into the live selftests and run when the device has been instantiated - hw interactions are real. v2: Add a macro for compiling conditional code for mock objects inside real objects. v3: Differentiate between mock unit tests and late integration test. v4: List the tests in natural order, use igt to sort after modparam. v5: s/late/live/ v6: s/unsigned long/unsigned int/ v7: Use igt_ prefixes for long helpers. v8: Deobfuscate macros overriding functions, stop using -I$(src) Signed-off-by: Chris Wilson <chris@chris-wilson.co.uk> Reviewed-by: Tvrtko Ursulin <tvrtko.ursulin@intel.com> Link: http://patchwork.freedesktop.org/patch/msgid/20170213171558.20942-1-chris@chris-wilson.co.uk
2017-02-13 17:15:12 +00:00
module_param_named_unsafe(live_selftests, i915_selftest.live, int, 0400);
MODULE_PARM_DESC(live_selftests, "Run selftests after driver initialisation on the live system (0:disabled [default], 1:run tests then continue, -1:run tests then exit module)");
module_param_named_unsafe(perf_selftests, i915_selftest.perf, int, 0400);
MODULE_PARM_DESC(perf_selftests, "Run performance orientated selftests after driver initialisation on the live system (0:disabled [default], 1:run tests then continue, -1:run tests then exit module)");